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rev description date prep appd b 05 - 0448 3 /1/05 ks ks approvals date vectron international mount holly springs, pa 17065 prepared by k. sheriff 3/3/03 oscillator specification process d . risser 6/23/04 quality r.l. smith 6/30/04 hi - rel standard ocx o engineer k. sheriff 5/7/04 code ident no size dwg. no. rev 00136 a os - 80001 b unspecified tolerances: n/a sheet 1 0f 15 v ectron international proprietary
size code ident no. unspecified tolerances dwg no. rev. sheet a 00136 n/a os - 80001 b 2 1. scope 1.1 general. this specification defines the design, assembly and functional evaluation of high reliability oven - controlled crystal oscillators (ocxo) produced by vectron international. devices delivered to this specification are processed with standard documents, procedures, and processes developed by vectron international . ordering information, including an order entry sheet, is detailed to facilitate part number definition and ordering. 1.2 classification. all devices defined by this specification are type 4 or type 6 oscillators in accordance with (iaw) mil - prf - 55310. 1.2.1 part number breakdown. C499 1 r a - 0001 s | | | | | | ----------- --------------- --------------- --------------- --------------- - -------------- base model # oscillator class (see 1.2.2) radiation environment (see 1.2.3) temperature range (see 1.2.4) dash number (see 1.2.5) screening option (see 1.2.6) 1.2.2 oscillator class. the oscillator classes covered by this specification ar e identified buy technology class as follows: class 1 --- oscillators using discrete technology. this technology uses exclusively discrete type electronic parts (including surface mount devices) assembled and interconnected on a printed circuit board or a n insulating substrate. class 2 --- oscillators using microelectronic (hybrid) technology. this technology uses microelectronic circuit elements electrically and mechanically interconnected on an insulating substrate upon which resistors, capacitors, or co nductors have been deposited, and used in a package that will be backfilled with an inert gas. class 3 --- oscillators using mixed technology (i.e., a combination of discrete technology and microelectronic technology). 1.2.3 radiation environment. the rad iation environment is identified by a single letter as follows : r --- radiation environment, swept high q synthetic quartz x --- non - radiation environment, high q synthetic quartz
size code ident no. unspecified tolerances dwg no. rev. sheet a 00136 n/a os - 80001 b 3 1.2.4 temperature range. the operating temperature range is identified b y a single letter as follows: a --- other, customer specified b --- 0c to +50c c --- 0c to +70c d --- - 20c to +70c e --- - 40c to +70c f --- - 40c to +85c l --- - 55c to +85c 1.2.5 dash number. the dash number uniquely identifies the ocxo. the d ash number will be assigned by vectron international after order placement, or prior to order placement if the customer requires the dash number to be placed on the official purchase order. 1.2.6 screening option. the screening option is identified by a s ingle letter as follows. see table 1 and 2 for detailed screening information. a --- customer specified s --- product level s, mil - prf - 55310 (high reliability space applications). for class 2 and 3 oscillators, microelectronics will be screened iaw m il - prf - 38534, class k. b --- product level b, mil - prf - 55310 (high reliability applications). for class 2 and 3 oscillators, microelectronics will be screened iaw mil - prf - 38534, class h. r --- modified mil - prf - 55310, product level b. for class 1 oscilla tors, plastic encapsulated surface mount devices screened iaw with mil - prf - 19500 for jantx parts may be used. for class 2 and 3 oscillators, microelectronics will not be screened. e --- engineering model (em) (see note 1) p --- proof of design (pod) / prototype (see note 1) note 1: when option e or p is selected, unscreened or commercial grade components may be used in the product.
size code ident no. unspecified tolerances dwg no. rev. sheet a 00136 n/a os - 80001 b 4 2. applicable documents 2.1 specifications and standards. the following specifications and standards form a part of this document to the extent specified herein. the issue currently in effect on the date of quotation will be the product baseline, unless otherwise specified. specification mil - prf - 55310 --- oscillator, crystal controlled, general specification for mil - prf - 38534 --- hybrid microcirc uits, general specification for standards mil - std - 202 --- test methods for elec tr onic and electrical component parts mil - std - 794 --- parts and equipment, procedures for packaging of mil - std - 883 --- test method standard micro circuits vectron international qsp - 90100 --- quality systems manual qsp - 90401 --- reliability assurance procedure for new products qsp - 90800 --- product identification and traceability procedure qsp - 91502 --- electrostatic discharge precautions procedure gr - 53731 --- work instructions for packaging and shipping other ipc - a - 610 --- acceptability of electronic assemblies 2. 2 order of precedence. in the event of a conflict between the text of this document and the references cited herein , the text of this document takes precedence. 3. general requirements 3.1 design and construction . the ruggedized designs implemented for these devices are proven in military and space applications under extreme environments. typical designs utilize 4 - point crystal moun ting and established reliability components. when specified, r a d i a t i o n h a r d e n i n g u p t o 1 0 0 k r a d ( s i ) c a n b e i n c l u d e d w i t h o u t a l t e r i n g t h e d e v i c e s i n t e r n a l topography. 3.2 assembly and workmanship. all devices delivered to this specification are assembled iaw mil - prf - 55310 and ipc - a - 610, class 3. 3.3 electrical . unless specified otherwise, all devices delivered to this specification are tested iaw mil - prf - 55310.
size code ident no. unspecified tolerances dwg no. rev. sheet a 00136 n/a os - 80001 b 5 3.4 inspection. the inspection requirements of mil - prf - 55310 apply to all devices delivered to this document. inspection conditions and standards are documented in accordance with the quality assurance system as defined in qsp - 90100 (iso - 9001 derived). 3.5 traceability. a c t i v e d e v i c e l o t s a r e h o m o g e n o u s a n d t r a c e a b l e t o t h e m a n u f a c t u r e r s indi vidual wafer. crystals are traceable to the quartz bar and the processing details of the autoclave lot, as applicable. all other elements and materials are traceable to their incoming inspection lots . 3.6 marking. device marking shall be in accordance with th e requirements of mil - prf - 55310. 3.7 packaging. all devices delivered are packaged in such a manner that they will be protected from damage during shipping, handling, and storage. devices are packaged in anti - static packaging and identified as bei ng static sensitive in accordance with qsp - 91502. 4. detail requirements 4.1 components. 4.1.1 crystals. design and construction of crystal units are in accordance with mil - c - 3098 and the applicable detailed crystal specification drawing for the device being delivered. crystal units utilize a 4 point mount structure. when radiation environment r is specified (see paragraph 1.2.3) premium q swept cultured quartz will be used. 4.1.2 discrete passive components. discrete passive components are either hig h reliability military parts or established reliability (er) military parts with a failure rate level r or better. ceramic capacitors are procured per mil - c - 123 or are subjected to destructive physical analysis (dpa) and humidity, steady state and low volt age testing iaw mil - c - 123. 4.1.3 packaged semiconductors . packaged semiconductors are of the type jan, jantx, or jantxv iaw mil - prf - 19500. class 1 oscillators, screening option r, may use plastic encapsulated surface mount devices screened iaw with mil - p rf - 19500 for jan or jantx. 4.1.4 microcircuits. microcircuits are procured from wafer lots that have passed mil - prf - 55310 lot acceptance tests for class s devices. 4.1.5 hybrid elements. the dies used in hybrid circuitry are procured from wafer lots th at have passed mil - prf - 55310 lot acceptance tests for class s devices. multilayer, ceramic chip capacitors are subjected to dpa, and humidity, steady state and low voltage testing in accordance with mil - c - 123. 4.2 materials . the materials, packages, ter minals, and finishes used in the construction of devices, procured per this specification, shall meet the requirements of mil - prf - 55310.
size code ident no. unspecified tolerances dwg no. rev. sheet a 00136 n/a os - 80001 b 6 5. quality assurance provisions and verification 5.1 verification and test. device lots are tested prior to delive ry in accordance with the a p p l i c a b l e s c r e e n i n g o p t i o n l e t t e r a s s t a t e d o n t h e c u s t o m e r s p u r c h a s e o r d e r . t a b l e 1 tests are conducted in the order shown and annotated on the appropriate process travelers and data sheets of the governing test procedure. 5. 2 test conditions. unless otherwise stated herein, inspections are performed in accordance with those specified in mil - prf - 55310 and mil - prf - 38534, in that order. process travelers identify the applicable methods, conditions and procedures to be used. 5.3 deliverables. the manufacturer supplies the following data, as a minimum, with each lot of devices: completed assembly and screening lot travelers, including rework history. electrical test variables data, identified by unique serial number. dat a as required by purchase order. 5.4 conformance inspection. when specified on the purchase order, group a and b conformance inspection will be performed iaw mil - prf - 55310. 5.5 group c inspection. when specified on the purchase order, group c inspecti on will be performed iaw mil - prf - 55310. 6. ordering information 6.1 part number. define part number as detailed in paragraph 1.2 of this document. 6.2 detailed requirements . complete the order entry sheet, attached to the end of this document, for speci fic information concerning the oscillator requirements. if the requirement is not applicable place an na in the appropriate field. it is very important not to over specify a requirement. we at vectron international fully understand that the customer may no t have the ability to determine all of the requirements noted on the order entry sheet. if at any time a question arises, please contact your sales representative and/or our hi - rel/military engineering group to assist you. 6.3 environmental conditions. sp ecify the detailed environmental conditions for the oscillator on the order entry sheet attached to the end of this document. if the requirement is not applicable place an na in the appropriate field.
size code ident no. unspecified tolerances dwg no. rev. sheet a 00136 n/a os - 80001 b 7 6.4 oscillator package. depending on package chosen, some electrical parameters or screening options may not be available. type a other, customer defined type b class 1 oscillators (see figure 1) type c class 2 oscillators (see figure 2) type d class 3 oscillators (see figure 3) 6.5 additional orde ring information. the following is a list of options that can be added by purchase order request. group a inspection iaw mil - prf - 55310 group b inspection iaw mil - prf - 55310 group c inspection iaw mil - prf - 55310 internal water - vapor content (rga) samples an d test performance destruct physical analysis (dpa) test specimens reliability predictions (mtbf) m a n u f a c t u r e r s p a r t s l i s t deliverable process identification documentation (pid) program management customer source inspection (pre - cap / final)
size code ident no. unspecified tolerances dwg no. rev. sheet a 00136 n/a os - 80001 b 8 screening requirements (100%) for class 1 and 3 oscillators: process id operation listing option s (mil - prf - 55310 product level s) option b (mil - prf - 55310 product level b) option r (modified mil - prf - 55310 product level b) option e (eng. model) option p (pod/pro totype) 1 random vibration mil - std - 202, meth 214, cond i - b, duration 5 minutes per axis n/a n/a n/a n/a 2 thermal shock mil - std - 202, meth 107, test condition letter a - 1 mil - std - 202, meth 107 test condition letter a mil - std - 202, meth 107 test condition le tter a n/a n/a 3 electrical test (pre burn - in) input current - power output waveform output voltage - power as specified mil - prf - 55310, par. 4.8.5 mil - prf - 55310, par. 4.8.20 mil - prf - 55310, par. 4.8.21 customer po n/a n/a n/a customer po n/a n/a n/a custome r po n/a n/a n/a customer po n/a n/a n/a customer po 4 burn - in (load) maximum specified operating temperature, nominal supply voltage and burn - in load, 240 hours minimum maximum specified operating temperature, nominal supply voltage and burn - in load, 160 hours minimum maximum specified operating temperature, nominal supply voltage and burn - in load, 160 hours minimum room temperature, nominal supply voltage and load, 160 hours minimum n/a 5 electrical test (post burn - in) input current - power output wave form output voltage - power as specified mil - prf - 55310, par. 4.8.5 mil - prf - 55310, par. 4.8.20 mil - prf - 55310, par. 4.8.21 customer po mil - prf - 55310, par. 4.8.5 mil - prf - 55310, par. 4.8.20 mil - prf - 55310, par. 4.8.21 customer po mil - prf - 55310, par. 4.8.5 mil - prf - 55310, par. 4.8.20 mil - prf - 55310, par. 4.8.21 customer po room temperature only mil - prf - 55310, par. 4.8.5 mil - prf - 55310, par. 4.8.20 mil - prf - 55310, par. 4.8.21 customer po room temperature only mil - prf - 55310, par. 4.8.5 mil - prf - 55310, par. 4.8.20 mil - p rf - 55310, par. 4.8.21 customer po 6 seal test (if applicable) mil - std - 202, meth 112, test condition letter d mil - std - 202, meth 112, test condition letter d mil - std - 202, meth 112, test condition letter d mil - std - 202, meth 112, test condition letter d mil - s td - 202, meth 112, test condition letter d 7 radiographic mil - std - 202, meth 209, test condition letter b n/a n/a n/a n/a table 1 - class 1 and 3 test matrix
size code ident no. unspecified tolerances dwg no. rev. sheet a 00136 n/a os - 80001 b 9 screening requirements (100%) for class 2 oscillators: process id operation listing op tion s (mil - prf - 55310 product level s) option b (mil - prf - 55310 product level b) option r (modified mil - prf - 55310 product level b) option e (eng. model) option p (pod/prototype) 1 non - destruct bond pull mil - std - 883, meth 2023 n/a n/a n/a n/a 2 internal visual mil - std - 883, meth 2017 cond h, meth 2032 cond m mil - std - 883, meth 2017 cond h, meth 2032 cond m mil - std - 883, meth 2017 cond h, meth 2032 cond m mil - std - 883, meth 2017 cond h, meth 2032 cond m n/a 3 stabilization bake (prior to seal) mil - std - 883, m eth 1008, cond c, 150c, 48 hours min. mil - std - 883, meth 1008, cond c, 150c, 24 hours min. mil - std - 883, meth 1008, cond c, 150c, 24 hours min. mil - std - 883, meth 1008, cond c, 150c, 24 hours min. mil - std - 883, meth 1008, cond c, 150c, 24 hours min. 4 t hermal shock mil - std - 883, meth 1011, cond a n/a n/a n/a n/a 5 temperature cycle mil - std - 883, meth 1010, cond b mil - std - 883, meth 1010, cond b mil - std - 883, meth 1010, cond b mil - std - 883, meth 1010, cond b mil - std - 883, meth 1010, cond b 6 constant acc eleration mil - std - 883, meth 2001, cond a, y 1 p l a n e o n l y , 5 0 0 0 g s mil - std - 883, meth 2001, cond a, y 1 p l a n e o n l y , 5 0 0 0 g s mil - std - 883, meth 2001, cond a, y 1 p l a n e o n l y , 5 0 0 0 g s n/a n/a 7 seal: fine leak mil - std - 883, meth 1014, cond a2 mil - std - 883, meth 1014, cond a2 mil - std - 883, meth 1014, cond a2 mil - std - 883, meth 1014, cond a2 mil - std - 883, meth 1014, cond a2 8 seal: gross leak mil - std - 883, meth 1014, cond c mil - std - 883, meth 1014, cond c mil - std - 883, meth 1014, cond c mil - std - 883, meth 1014, cond c mil - std - 883, meth 1014, cond c 9 particle impact noise detection mil - std - 883, meth 2020, cond b n/a n/a n/a n/a 10 electrical test (pre burn - in) input current - power output waveform output voltage - power as specified mil - prf - 55310, par. 4.8.5 mil - prf - 55 310, par. 4.8.20 mil - prf - 55310, par. 4.8.21 customer po n/a n/a n/a customer po n/a n/a n/a customer po n/a n/a n/a customer po n/a n/a n/a customer po 11 burn - in (load) +125c, nominal supply voltage and burn - in load, 240 hours minimum +125c, nomin al supply voltage and burn - in load, 160 hours minimum +125c, nominal supply voltage and burn - in load, 160 hours minimum +25c, nominal supply voltage and burn - in load, 160 hours minimum n/a 12 electrical test (pre burn - in) input current - power output wav eform output voltage - power as specified nominal and extreme supply voltages, specified load, +23c and temperature extremes. mil - prf - 55310, par. 4.8.5 mil - prf - 55310, par. 4.8.20 mil - prf - 55310, par. 4.8.21 customer po nominal supply voltages, specified load , +23c and frequency verified at the temperature extremes. mil - prf - 55310, par. 4.8.5 mil - prf - 55310, par. 4.8.20 mil - prf - 55310, par. 4.8.21 customer po nominal supply voltages, specified load, +23c and frequency verified at the temperature extremes. mil - p rf - 55310, par. 4.8.5 mil - prf - 55310, par. 4.8.20 mil - prf - 55310, par. 4.8.21 customer po nominal supply voltages, specified load, +23c and frequency verified at the temperature extremes. mil - prf - 55310, par. 4.8.5 mil - prf - 55310, par. 4.8.20 mil - prf - 55310, pa r. 4.8.21 customer po nominal supply voltages, specified load, +23c. mil - prf - 55310, par. 4.8.5 mil - prf - 55310, par. 4.8.20 mil - prf - 55310, par. 4.8.21 customer po 13 radiographic inspection mil - std - 883, meth 2012 n/a n/a n/a n/a table 2 - class 2 test matrix
size code ident no. unspecified tolerances dwg no. rev. sheet a 00136 n/a os - 80001 b 10 enclosure: type b (class 1) figure 1 material: crs finish: hot solde r dip per mil - f - 14072 weight: : < 125 grams pin connections 1 case ground 2 efc 3 rf output 4 input voltage, oven 5 input voltage, oscillator 6 oven ready indicator (if required)
size code ident no. unspecified tolerances dwg no. rev. sheet a 00136 n/a os - 80001 b 11 enclosure: type c (class 2 ) figure 2 material: kovar per astm f - 15 finish: g old plating per mil - g - 452 04, type iii, grade a, class 1 over electrodeposited nickel per qq - n - 290, class 1 except that th e plating thickness shall be 100 to 250 microinches . weight: < 30 grams pin connections 1 efc 2 - 11 n/c 12 case ground 13 rf output 14 - 23 n/c 24 input voltage
size code ident no. unspecified tolerances dwg no. rev. sheet a 00136 n/a os - 80001 b 12 enclosure: type d (class 3 ) figure 3 material: 6061 - t6 aluminum finish: gold plating per mil - g - 4 5 2 0 4 , 5 0 u m i n . o v e r electrodeposited nickel iaw qq - n - 290 class i, grade e weight: < 100 grams pin connections 1 input voltage 2 efc (sma female) 3 ground 4 rf outpu t (sma female)
size code ident no. unspecified tolerances dwg no. rev. sheet a 00136 n/a os - 80001 b 13 o rder entry she et detailed requirements C499 _____ _____ _____ xxxx _____ | | | | | | ----------- --------------- --------------- --------------- --------------- --------------- base model # oscillator class (see 1.2.2) radiation environment (see 1.2.3) temperatur e range (see 1.2.4) dash number (see 1.2.5) screening option (see 1.2.6) electrical requirements 1,2 parameter nominal value limit (min.) limit (max.) unit options / ranges frequency (fo) mhz 1mhz - 125mhz set - on tolerance hz input vol tage 1 vdc 5v,12v,15v input power 1 turn - on w steady state @ +25c w steady state @ minimum operating temperature w input voltage 2 vdc 5v,12v,15v input power 2 turn - on w steady state @ +25c w st eady state @ minimum operating temperature w rf output power dbm 0 to +10dbm harmonics dbc spurious (fo 1mhz) dbc spurious (dc to 1.6ghz) dbc electronic frequency control input voltage range v frequency de viation f / f slope negative or positive --- linearity % oven ready indicator turn - on v steady state v
size code ident no. unspecified tolerances dwg no. rev. sheet a 00136 n/a os - 80001 b 14 frequency stability 1, 2,4 parameter limit (max.) unit condition frequency vs. temperature f / f warm - up time temper ature = +25c f / f f , _ _ _ _ m i n u t e s t o _ _ _ _ m i n u t e s a f t e r t u r n - on temperature = minimum operating temperature f / f f , _ _ _ _ m i n u t e s t o _ _ _ _ m i n u t e s a f t e r t u r n - on frequency vs. voltage f / f frequency vs. load f / f aging daily f / f at t ime of shipment yearly f / f other f / f phase noise (static) 1 hz dbc/hz 10 hz dbc/hz 100 hz dbc/hz 1 k hz dbc/hz 10 k hz dbc/hz 100 k hz and above dbc/hz short term stability (static) = 0 . 0 1 s e c . f / f = 0.1 sec. f / f = 1 . 0 s e c f / f = 1 0 . 0 s e c . f / f acceleration sensitivity (2g tip - over) x axis ppb/g y axis ppb/g z axis ppb/g total gamma ppb/g
size code ident no. unspecified tolerances dwg no. rev. sheet a 00136 n/a os - 80001 b 15 mechanical specifica tions 1,4 parameter type comment customer spec ified enclosure a customer outline required class 1 oscillators b see figure 1 class 2 oscillators c see figure 2 class 3 oscillators d see figure 3 environmental condit ions 1 ,4 parameter limit (min.) limit (max.) unit condition operating temp erature range c extended temperature range c operational, non - specification compliant storage temperature range c radiation rad(si) random vibration mil - std - 202, method 214, test condition ____, letter _____ vibration, high frequenc y mil - std - 202, method 204, test condition ____ shock mil - std - 202, method 213, test condition ____ ambient pressure mil - std - 202, method 105, test condition ____ constant acceleration mil - std - 202, method 212, test condition ____ humidity (steady sta te) mil - std - 202, method 103, test condition ____ additional informati on 4 parameter required condition / comment group a inspection group b inspection group c inspection internal water - vapor content (rga) destruct physical analysis (dp a) reliability predictions (mtbf) 3 hours: ____________ m a n u f a c t u r e r s p a r t s l i s t deliverable process identification documentation (pid) program management customer source inspection (pre - cap / final) other: (list below) notes: 1 not all options and codes are available at all frequencies and configurations . 2 unless otherwise stated , all values are valid after warm - up time and refer to typical conditions for supply voltage, frequency control voltage, load, temperature (25c) 3 mean time between failure calculated iaw mil - hdbk - 217 4 any field left blank will be assigned n/a. see para graph 6.2 for additional information.

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